photon-beam-induced current

photon-beam-induced current
1) Солнечная энергия: ток, индуцированный пучком фотонов
2) Макаров: ток, индуцируемый пучком фотонов

Универсальный англо-русский словарь. . 2011.

Игры ⚽ Нужна курсовая?

Смотреть что такое "photon-beam-induced current" в других словарях:

  • Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… …   Wikipedia

  • Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s …   Wikipedia

  • Electromagnetically induced transparency — The effect of EIT on a typical absorption line. A weak probe normally experiences absorption shown in blue. A second coupling beam induces EIT and creates a window in the absorption region (red). This plot is a computer simulation of EIT in an… …   Wikipedia

  • List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia

  • Microscope électronique à balayage — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

  • Microscopie electronique a balayage — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

  • Microscopie Électronique À Balayage — Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

  • Microscopie électronique à balayage — Pour les articles homonymes, voir MEB, SEM, Microscope (homonymie) et Microscopie. Microscope électronique à balayage JEOL JSM 6340F La microscopie éle …   Wikipédia en Français

  • Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

  • Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… …   Wikipedia

  • Caesar Saloma — Caesar A. Saloma is a professor of physics at the [http://www.nip.upd.edu.ph National Institute of Physics] , University of the Philippines, Diliman, Quezon City, Philippines. He is currently the Dean of the College of Science, University of the… …   Wikipedia


Поделиться ссылкой на выделенное

Прямая ссылка:
Нажмите правой клавишей мыши и выберите «Копировать ссылку»